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Silicon semiconductor device and method - in which island region is defined by a mask and electrode zones and active regions are formed in a self-aligned manner

机译:硅半导体器件和方法-岛区由掩模限定,电极区和有源区以自对准方式形成

摘要

In the mfr. of a semiconductor device using self-aligned techniques, an oxidn. preventing layer (2) and a masking layer are successively formed on Si substrate (1). The masking layer comprises a layer of first material (3), edge (5) of which a layer of second material is formed which is selectively etchable with respect to the first material and the oxidn. preventing layer. After the exposed portion of the oxidn. preventing layer has been removed, insulation region (8) surrounding island region (9a) of the substrate is formed. When the edge portion (5) and the underlying oxidn. preventing layer are etched simultaneously, an electrode region (33) is defined and formed of poly Si (16). At least one zone of a semiconductor element is then formed in a self-aligned manner in island region (9a).
机译:在制造商。使用自对准技术的半导体器件的氧化物。阻挡层(2)和掩模层依次形成在硅衬底(1)上。掩模层包括第一材料层(3),其边缘(5)形成第二材料层,该第二材料层相对于第一材料和氧化物可选择性地蚀刻。防护层。氧化后露出部分。除去保护层,形成围绕衬底岛区域(9a)的绝缘区域(8)。当边缘部分(5)与下层氧化时。同时腐蚀防止层,形成电极区域(33)并由多晶硅(16)形成。然后在岛区域(9a)中以自对准的方式形成半导体元件的至少一个区域。

著录项

  • 公开/公告号NL8601039A

    专利类型

  • 公开/公告日1987-11-16

    原文格式PDF

  • 申请/专利权人 N.V. PHILIPS GLOEILAMPENFABRIEKEN TE EINDHOVEN.;

    申请/专利号NL19860001039

  • 发明设计人

    申请日1986-04-23

  • 分类号H01L29/78;H01L29/72;

  • 国家 NL

  • 入库时间 2022-08-22 06:59:37

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