首页> 外国专利> Method of and apparatus for fault detection in digital circuits by comparison of test signals applied to a test circuit and a faultless reference circuit

Method of and apparatus for fault detection in digital circuits by comparison of test signals applied to a test circuit and a faultless reference circuit

机译:通过比较施加到测试电路和无故障参考电路的测试信号在数字电路中进行故障检测的方法和设备

摘要

A fault detection system for electronic circuits is disclosed which comprises a detection circuit in which the crosscorrelation values between the test signal sequence, input to a circuit to be tested, and the output signal sequence from it, with no delay and with delays made in steps to a predetermined time interveral either in the test input signal or in the output sequence, are counted, a reference circuit in which the crosscorrelation values between the test signal sequence input to a faultless reference circuit and the output signal sequence from it, are counted, and a comparator for comparing the crosscorrelation values from both the detection and reference circuit. In one preferred embodiment, one or more of the conventional data compression methods selected from the group of the one's counting, transistion counting, auto-correlation, and C. R. C. methods are incorporated for operation in conjunction with the system.
机译:公开了一种用于电子电路的故障检测系统,其包括检测电路,在该检测电路中,输入到要测试的电路的测试信号序列和来自该测试信号序列的输出信号序列之间的互相关值没有延迟并且具有逐步的延迟。计数到在测试输入信号或在输出序列中的预定时间之间的预定时间,在参考电路中对输入到无故障参考电路的测试信号序列与从其输出的信号序列之间的互相关值进行计数,一个比较器,用于比较来自检测电路和参考电路的互相关值。在一个优选的实施例中,从一个人的计数,跨度计数,自相关和C.R.C.方法的组中选出的一种或多种常规数据压缩方法结合该系统进行操作。

著录项

  • 公开/公告号US4710932A

    专利类型

  • 公开/公告日1987-12-01

    原文格式PDF

  • 申请/专利权人 HIROSHI;KASHIWAGI;

    申请/专利号US19860819225

  • 发明设计人 KASHIWAGI HIROSHI;

    申请日1986-01-15

  • 分类号G06F11/00;

  • 国家 US

  • 入库时间 2022-08-22 06:49:43

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