首页> 外国专利> Profile-measuring light probe using a change in reflection factor in the proximity of a critical angle of light

Profile-measuring light probe using a change in reflection factor in the proximity of a critical angle of light

机译:在临界光角附近使用反射系数的变化进行轮廓测量的光探头

摘要

A profile-measuring light probe includes: an illuminator for irradiating a fine spot of light on a subject to be measured; an objective lens for forming an image of the fine spot on an image plane; and a relay lens for converting the light from the fine spot into a generally parallel ray. Further, the light probe includes a window plate constituted by an entrance prism for taking in the generally parallel ray emitted from the relay lens; a flat glass for subjecting the taken-in ray to multiple internal reflections and transmitting the same, and an exit prism for outputting the ray thus transmitted to the outside. The light probe measures the distribution of light quantity of the light emitted from the window plate to thereby measure a profile of the subject to be measured. With the above-described arrangement, it becomes possible for the light probe to perform the measuring through the utilization of a change in reflection factor of a light inciding in the proximity of a critical angle without using a critical angle prism.
机译:轮廓测量光探头包括:照明器,用于向要测量的对象照射光的细点;以及照明器。物镜,用于在像平面上形成细点的图像;中继透镜用于将来自细点的光转换为大致平行的光线。此外,光探测器包括由入射棱镜构成的窗板,用于吸收从中继透镜发射的大致平行的光线。平板玻璃,用于使入射的射线经受多次内反射并将其透射,以及出射棱镜,用于将如此透射的射线输出至外部。光探测器测量从窗板发射的光的光量的分布,从而测量要测量的被摄体的轮廓。利用上述布置,光探针可以通过利用入射在临界角附近的光的反射系数的变化来执行测量而无需使用临界角棱镜。

著录项

  • 公开/公告号US4743770A

    专利类型

  • 公开/公告日1988-05-10

    原文格式PDF

  • 申请/专利权人 MITUTOYO MFG. CO. LTD.;

    申请/专利号US19860909926

  • 发明设计人 CHIA S. LEE;

    申请日1986-09-22

  • 分类号G01B11/24;

  • 国家 US

  • 入库时间 2022-08-22 06:49:08

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