ADJUSTING METHOD OF ANALYTICAL SAMPLE OF LIGHT ELEMENT BY ELECTRON BEAM PROBE X-RAY ANALYSIS

摘要

PURPOSE:To improve the precision in a quantitative analysis of carbon or the like, by a method wherein the water subjected to a purifying treatment such as distillation or ion exchange is used as a lubricating agent at least in a grinding process when an analytical sample containing a light element of an atomic number 20 or below is adjusted. CONSTITUTION:On the occasion when an analytical sample containing a light element of an atomic number 20 or below is adjusted, a grinder is employed for grinding a test piece, and alumina or the like is used as an abrasive material. In addition, distilled water is used as the water subjected to a purifying treatment and to be provided for grinding and washing. After the piece is finished to be specular, washing water on the surface is blown away by a hot-air drier, and the test dried up completely is set on a sample stage of an analyzing apparatus as quickly (within 5-10min) as possible, so as to be subjected to measurement. In this way, the precision in a quantitative analysis of carbon or silicon or the like can be improved.