首页> 外国专利> ELECTRON TEMPERATURE MEASURING METHOD WITH ASYMMETRICAL DOUBLE PROBE

ELECTRON TEMPERATURE MEASURING METHOD WITH ASYMMETRICAL DOUBLE PROBE

机译:不对称双探针的电子温度测量方法

摘要

PURPOSE:To improve a time response and an expense curtailment etc., by intermittently impressing AC voltage between two asymmetrical probes placed in a plasma, and measuring the variation part of the voltage produced by the impression in the state where a current is not flowing. CONSTITUTION:The output of a high frequency oscillator 1 and a square wave generation circuit 2 is modulated in a modulation circuit 3, then given between both probe electrodes of P1 and P2 via a transformer T and a condenser C. A filter 4 is to eliminate a higher harmonic component, and the output of the circuit 2 is detected as a reference signal with a detection circuit 5. The voltage between both probes of P1 and P2 becomes the voltage corresponding to a point Vf' at the period T1 when a high frequency signal is produced to the output of the circuit 3. And a point Vf corresponds to Vf' at the period T2 when the said signal is unproduced. This makes a detection output to a Vf-Vf' square wave. The size of Vf-Vf' depends on the amplitude of a modulation output signal, and an electron temperature can be determined by the relation.
机译:目的:通过在等离子体中放置两个不对称探针之间的交流电压间歇性地施加交流电压,并在电流不流动的状态下测量压印产生的电压的变化部分,以改善时间响应和减少费用等。组成:高频振荡器1和方波生成电路2的输出在调制电路3中进行调制,然后通过变压器T和电容器C在P1和P2的两个探测电极之间给定。滤波器4用于消除较高的谐波分量,并且通过检测电路5将电路2的输出检测为参考信号。当高频时,在周期T1时,P1和P2的两个探针之间的电压变为对应于点Vf'的电压。信号Vf被产生到电路3的输出。当不产生所述信号时,在周期T2,点Vf对应于Vf′。这使得检测输出为Vf-Vf'方波。 Vf-Vf’的大小取决于调制输出信号的幅度,并且电子温度可以通过该关系确定。

著录项

  • 公开/公告号JPH01186597A

    专利类型

  • 公开/公告日1989-07-26

    原文格式PDF

  • 申请/专利权人 RIKAGAKU KENKYUSHO;

    申请/专利号JP19880005486

  • 发明设计人 AMAMIYA HIROSHI;SHIMIZU KAZUO;

    申请日1988-01-13

  • 分类号H05H1/00;

  • 国家 JP

  • 入库时间 2022-08-22 06:45:07

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