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METHOD FOR DETECTING TEMPERATURE OF MELT IN CZOCHRALSKI METHOD

机译:直拉法测定熔体温度的方法

摘要

PURPOSE:To continuously and accurately detect the temp. of a melt and to improve the accuracy of single crystal pulling up work by indirectly measuring the temp. of the melt from the amplitude and period of fluctuation on the surface of the melt. CONSTITUTION:The surface of a melt 2 is irradiated with light 9 such as laser light and the light 9 is reflected. This reflected light 7 oscillates in accordance with fluctuation on the surface of the melt 2. The fluctuation amplitude and oscillation period of the optical axis of the reflected light 7 are measured, the intensity of the fluctuation is calculated from the measured values and the temp. of the melt 2 is calculated from the calculated intensity.
机译:目的:连续准确地检测温度。并通过间接测量温度来提高单晶提拉工作的精度。熔体表面的波动幅度和周期来确定熔体的质量。组成:熔体2的表面受到激光9等光9的照射,并且光9被反射。该反射光7根据熔体2的表面上的波动而振荡。测量反射光7的光轴的波动幅度和振荡周期,并根据测量值和温度来计算波动的强度。从计算出的强度计算出熔体2的厚度。

著录项

  • 公开/公告号JPH02279585A

    专利类型

  • 公开/公告日1990-11-15

    原文格式PDF

  • 申请/专利号JP19890100928

  • 发明设计人 TSUJINO AKIRA;

    申请日1989-04-20

  • 分类号C30B15/26;H01L21/208;

  • 国家 JP

  • 入库时间 2022-08-22 06:02:20

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