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MEASURING METHOD OF SURFACE ROUGHNESS OF SOLID BY ULTRASONIC WAVE

机译:超声波测量固体表面粗糙度的方法

摘要

PURPOSE:To enable measurement of the surface roughness of a solid by a method wherein a back scattered wave due to roughness of the surface of a substance to be inspected is received by a probe and an echo level thereof is compared with a correlative value of the surface roughness with the echo level of the back scattering wave which is determined beforehand. CONSTITUTION:When a minute indentation 1b exists in a part of the smooth surface 1a of a substance to be inspected, an ultrasonic wave falling on the surface 1a is back-scattered at the part of the indentation 1b due to roughness thereof and a back scattered wave 14 thereof is received by a probe P, while it is reflected specularly on the smooth surface and a reflected wave thereof is not received. An echo level of the scattered wave 14 is compared with a correlative value of the surface roughness with the echo level of the back scattered wave which is determined by measurement with respect to a test piece beforehand, and thereby the surface roughness of the substance 1 to be inspected is measured. Although scanning is made for shifting a position of measurement, subsequently, the surface roughness can be measured on the occasion by scanning in one direction irrespective of a shape, direction, etc. such as the indentation and a stepped part, since the vector of the ultrasonic wave falling on the surface 1a has an equal direction.
机译:目的:为了能够通过一种方法测量固体的表面粗糙度,其中一种方法是通过探头接收由于待检查物质表面的粗糙度而产生的反向散射波,并将其回波电平与测量值的相关值进行比较。表面粗糙度与预先确定的反向散射波的回波水平有关。组成:当待检查物质的光滑表面1a的一部分中存在微小的凹痕1b时,落在表面1a上的超声波由于其粗糙度和向后散射而在凹痕1b的该部分处反向散射探针P接收其反射波14,而在光滑表面上镜面反射该反射波14,而未接收其反射波。将散射波14的回波电平与表面粗糙度与后向散射波的回波电平的相关值进行比较,该相关值是通过事先对测试件进行测量而确定的,从而将物质1的表面粗糙度与被检查被测量。尽管进行扫描以移动测量位置,但是随后,可以通过在一个方向上进行扫描来测量表面粗糙度,而与凹痕和台阶部分等形状,方向等无关,因为落在表面1a上的超声波具有相同的方向。

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