首页> 外国专利> STRUCTURE FOR INFLUENCING THE EFFECT OF X-RAY OR GAMMA RADIATION ON A TARGET SENSITIVE TO THE RADIATION

STRUCTURE FOR INFLUENCING THE EFFECT OF X-RAY OR GAMMA RADIATION ON A TARGET SENSITIVE TO THE RADIATION

机译:影响X射线或伽玛射线辐射对辐射敏感目标的结构

摘要

The present invention refers to a structure for influencing the effect of X-ray or gamma radiation on a target sensitive to the radiation (R), having a first and a second side, the X-ray or gamma radiation (R) striking the first side, the structure comprising at least one group of layers (1, 3, 5, 7) emitting a secondary radiation under the influence of the X -ray or gamma radiation (R) or the secondary radiation of layers (1, 3, 5, 7) arranged behind the first side in the way of propagation of the X-ray or gamma radiation (R). The essence of the invention lies comprising in the group at least a basic layer (1) and a second (3) layer arranged in a sequence of the atomic numbers of elements forming the layers (1, 3, 5, 7), wherein the basic layer is made of a metal selected from the group consisted of 28Pb, 74W and 73Ta, the second layer of a metal selected from the group consisted of 47Ag, 42Mo, 41Nb, 29Cu, 28Ni, 23V and 13Al. FIG. 2.
机译:本发明涉及一种结构,该结构用于影响X射线或伽玛射线对对辐射(R)敏感的目标的效果,该靶具有第一侧面和第二侧面,X射线或伽玛射线(R)撞击第一侧面和第二侧面。侧面,该结构包括在X射线或γ射线(R)或层(1、3、5的次级辐射)的影响下发射次级辐射的至少一组层(1、3、5、7) ,7)以X射线或伽马射线(R)的传播方式布置在第一侧的后面。本发明的实质在于,至少包括基础层(1)和第二层(3),所述基础层(1)和第二层(3)以形成所述层(1、3、5、7)的元素的原子序数排列。基本层由选自28Pb,74W和73Ta的金属制成,第二层选自47Ag,42Mo,41Nb,29Cu,28Ni,23V和13Al的金属制成。图。 2。

著录项

  • 公开/公告号CA2004902A1

    专利类型

  • 公开/公告日1991-06-07

    原文格式PDF

  • 申请/专利权人 TELEKI PETER;

    申请/专利号CA19892004902

  • 发明设计人 TELEKI PETER;

    申请日1989-12-07

  • 分类号G21K3/00;

  • 国家 CA

  • 入库时间 2022-08-22 05:55:53

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