IC TESTER AND COMMAND DATA STORING METHOD IN PIN COMMAND REGISTER OF IC TESTER

摘要

PURPOSE:To efficiently store command data in a pin command register by simultaneously storing the same command data in the same pins of respective ICs. CONSTITUTION:The (N) taking mode signal inputted through a test address bus TAD is stored in an (N) taking mode register 1. Next, the pin address signal PAD indicating the pin command register corresponding to the specific pin among a plurality of the pins provided to a plurality of ICs to be measured is inputted to an address coder 2 through the bits b1-bm of the tester address bus TAD. The address coder 2 indicates the pin command register storing command data as follows: That is, output O11 enables the first pin command register of the first IC to be measured and, in the same way, the output O11 enables the pin command register.