PURPOSE:To manufacture a light emitting element and a photodetector which have high quality and high reliability by regulating thickness of growth in one time to the prescribed amount or below, in the case of growing the crystal layer of an InP-based compd. semiconductor by a liquid phase epitaxial crystal growing method. CONSTITUTION:The crystal layers of an InP-based compd. semiconductor (e.g. In1-xGaxAs1-yPy performs lattice matching with an InP base plate within a range of a/a=0.1%, at room temp. and has composition wherein band gap wavelength is regulated to 1.3-1.5mum) having =0.5mum thickness and the same composition, are laminated on the InP single crystal base plate having (100)+ or -1 deg. face exponent of the base plate surface. In this liquid phase epitaxial crystal growth, growth of the crystal layers is plurally divided and performed. For example, an n-type clad layer 32, p-type active layers 33a, 33b, a p-type clad layer 41, and a p-type contact layer 35 are successively formed on the InP base plate 31. Thickness of growth in one time is regulated to =0.5mum.
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机译:目的:在InP基复合材料的晶体层生长的情况下,通过一次将生长厚度调节到规定量以下,以制造具有高质量和高可靠性的发光元件和光电探测器。半导体通过液相外延晶体生长方法。组成:一个基于InP的晶体层。半导体(例如,In1-xGaxAs1-yPy在室温下与InP基板在a / a <= 0.1%的范围内进行晶格匹配,并且具有将带隙波长调节为1.3-1.5mum的成分)在具有(100)+或-1度的InP单晶基板上层压0.5mum厚度和相同的成分。底板表面的面指数。在该液相外延晶体生长中,晶体层的生长被多次分割并进行。例如,在InP基板31上依次形成n型覆盖层32,p型活性层33a,33b,p型覆盖层41和p型接触层35。一次被调节为<=0.5μm。
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