首页> 外国专利> METHOD AND APPARATUS FOR MEASURING POLISHING CAPACITY OF CHEMICAL POLISHING SOLUTION AND METHOD AND APPARATUS FOR CONTROLLING CHEMICAL POLISHING SOLUTION

METHOD AND APPARATUS FOR MEASURING POLISHING CAPACITY OF CHEMICAL POLISHING SOLUTION AND METHOD AND APPARATUS FOR CONTROLLING CHEMICAL POLISHING SOLUTION

机译:用于测量化学抛光溶液的抛光能力的方法和装置以及用于控制化学抛光溶液的方法和装置

摘要

PURPOSE:To simply detect the polishing capacity of a chemical polishing solution with high accuracy by bringing a first electrode part composed of a hardly soluble substance whose dissolving speed in the chemical polishing solution is marked low as compared with a material to be treated into contact with the chemical polishing solution to impart a minute current to said electrode part. CONSTITUTION:A first electrode part 12 composed of a hardly soluble substance whose dissolving speed in a chemical polishing solution 20 whose chemical polishing capacity must be measured is markedly low as compared with a material to be treated is brought into contact with the chemical polishing solution 20 to impact a minute current to the first electrode part. At this time, since the first electrode part 12 is composed of the hardly soluble substance whose dissolving speed in the chemical polishing solution 20 is markedly low as compared with the material to be treated, the accurate quantity of the state corresponding to the polishing capacity of the chemical polishing solution 20 is generated in the first electrode part 12. Subsequently, by calculating the quantity of chemical polishing force showing the chemical polishing capacity of the chemical polishing solution 20 from the obtained quantity of state by a chemical polishing force quantity calculating means 18, the polishing capacity of the chemical polishing solution 20 can be simply detected with high accuracy.
机译:目的:通过将由难溶性物质组成的第一电极部分置于化学抛光溶液中的溶解速度比待处理的材料低,来简单,高精度地检测化学抛光溶液的抛光能力。化学抛光液,以向所述电极部分施加微小电流。组成:第一电极部分12与化学抛光溶液20接触,第一电极部分12由难溶物质组成,该物质在必须测量化学抛光能力的化学抛光溶液20中的溶解速度明显低于待处理的材料使微小的电流流到第一电极部分。此时,由于第一电极部12由难溶性物质构成,因此与被处理材料相比,其在化学抛光液20中的溶解速度明显降低,因此准确的状态量对应于被抛光材料的抛光能力。在第一电极部12中生成化学研磨液20。接着,通过化学研磨力量计算单元18,根据求出的状态量,算出表示化学研磨液20的化学研磨能力的化学研磨力的量。因此,可以简单且高精度地检测化学研磨液20的研磨能力。

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