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HEAT TREATMENT OF NEUTRON-IRRADIATED SILICON SINGLE CRYSTAL

机译:中子辐照硅单晶的热处理

摘要

PURPOSE:To eliminate crystal defect generated by neutron irradiation and recover resistance by heat-treating a silicon single crystal subjected to neutron irradiation doping under a fixed condition. CONSTITUTION:A silicon single crystal subjected to neutron irradiation doping is heat treated at a temperature of 950-1200 deg.C for a fixed time (e.g. at a temperature of 1200 deg.C for =20min or at a temperature of 1000 deg.C for =120min). Thereby, crystal defect generated in the silicon single crystal by neutron irradiation is eliminated and stable practical resistance is recovered.
机译:目的:消除中子辐照产生的晶体缺陷,并通过在固定条件下对中子辐照掺杂的硅单晶进行热处理来恢复电阻。组成:将经过中子辐照掺杂的单晶硅在950-1200℃的温度下热处理一段固定的时间(例如,在1200℃的温度下≥= 20min或在1000℃的温度下)。 C> = 120分钟)。从而,消除了中子辐照在硅单晶中产生的晶体缺陷,并恢复了稳定的实用电阻。

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