Circuit and method for measuring the amount of influence on the capacitance-voltage characteristic of a capacitive element

摘要

PCT No. PCT/EP90/00612 Sec. 371 Date Sep. 25, 1991 Sec. 102(e) Date Sep. 25, 1991 PCT Filed Apr. 17, 1990 PCT Pub. No. WO90/13793 PCT Pub. Date Nov. 15, 1990.A circuit and a method for measuring a quantity influencing the capacitance-voltage characteristic of a capacitive element, the measuring accuracy and the signal-to-noise-ratio being improved by determining such quantity on the basis of the area under the curve of the capacitance-voltage characteristic.