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Angle measuring interferometer

机译:测角干涉仪

摘要

An angle measuring interferometer comprises a source (10) which emits a light beam (12) containing two orthogonally polarized components; a tilted shear plate (16) and a half-wave plate (29A) for converting said beam into two parallel beams (30, 33) with the same polarization; means including a polarizing beamsplitter (40), for causing each of the beams (30, 33) to be reflected once by each of two plane mirrors (71, 70) to produce two parallel output beams (60, 63) with the same polarization; a half-wave plate (29B) for converting said two beams into two output beams (62, 63) with orthogonal polarization, with the tilted shear plate (16) for converting said two output beams into a single output beam (80) in which the phase difference between the two components of said beam is proportional to the angle (0) between the two mirrors (70, 71); a photoelectric detector (83) to produce the measurement signal (85); and an electronic module (90) to indicate the phase difference which is proportional to the changes in the angular orientation between said two mirrors.
机译:角度测量干涉仪包括:光源(10),其发射包含两个正交偏振分量的光束(12);光源(10)。倾斜的剪切板(16)和半波板(29A),用于将所述光束转换成具有相同偏振的两个平行光束(30、33);包括偏振分束器(40)的装置,用于使每个光束(30、33)被两个平面镜(71、70)中的每个反射一次,以产生具有相同偏振的两个平行输出光束(60、63)。 ;半波片(29B),用于将所述两个光束转换为正交偏振的两个输出光束(62、63);倾斜剪切板(16),用于将所述两个光束转换为单个输出光束(80),其中所述光束的两个分量之间的相位差与两个反射镜(70、71)之间的角度(0)成比例。光电检测器(83)产生测量信号(85);电子模块(90),用于指示与所述两个反射镜之间的角度取向的变化成比例的相位差。

著录项

  • 公开/公告号EP0250306B1

    专利类型

  • 公开/公告日1992-09-23

    原文格式PDF

  • 申请/专利权人 ZYGO CORPORATION;

    申请/专利号EP19870401333

  • 发明设计人 SOMMARGREN GARY E.;

    申请日1987-06-12

  • 分类号G01B9/02;

  • 国家 EP

  • 入库时间 2022-08-22 05:30:29

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