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METHOD OF DETERMINATION OF SMALL-SIGNAL IMPEDANCE OF AVALANCHE TRANSIT TIME DIODE
METHOD OF DETERMINATION OF SMALL-SIGNAL IMPEDANCE OF AVALANCHE TRANSIT TIME DIODE
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机译:雪崩过渡时间二极管小信号阻抗的确定方法
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摘要
the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to vhf technique and can be used u0434u043bu00a0 u0438u0437u043cu0435u0440u0435u043du0438u00a0 parameters u043bu0430u0432u0438u043du043du043e - u043fu0440u043eu043bu0435u0442u043du044bu0445 diodes the u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 - improved accuracy u043fu043eu0441u0442u0430u0432u043bu0435 u043du043du0430u00a0 goal u0434u043eu0441u0442u0438u0433u0430u0435u0442u0441u00a0 in that way u043eu043fu0440u0435u0434u0435u043bu0435u043du0438u00a0 u043cu0430u043bu043eu0441u0438u0433u043du0430u043bu044cu043du043eu0433u043e impedance l, poa, based on measured parameters of the measuring chamber in conjunction with the u043bu043fu0434,u043fu0440u043eu0438u0437u0432u043eu0434u00a0u0442 measuring resonant frequency u043au0441u0432u043d when resonance measuring chamber with u0434u0438u043eu0434u043eu043c in four guided - senior u0440u0430u0441u0441u0442u043eu00a0u043du0438u00a0 from axis to u043au043eu0440u043eu0442u043au043eu0437u0430u043cu043au043du0443u0442u043e ldp in the end wall of the measuring chamber and on the obtained u0437u043du0430u0447u0435u043du0438u00a0u043c resonance frequencies, u043au0441u0432u043d and u0440u0430u0441u0441u0442u043eu00a0u043du0438u00a0 u0432u044bu0447u0438u0441u043bu00a0u044eu0442 search parameters. 2 il
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