DEVICE FOR INVESTIGATING MICROMECHANICAL PROPERTIES OF MATERIALS

摘要

the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 test materials, namely, the u0438u0437u043cu0435u0440u0435u043du0438u00a0u043c u043cu0438u043au0440u043eu0442u0432u0435u0440u0434u043eu0441u0442u0438, u043cu0438u043au0440u043eu0445u0440u0443u043fu043au043eu0441u0442u0438 et al. method u0432u0434u0430u0432u043bu0438u0432u0430u043du0438u00a0 or u0446u0430u0440u0430u043fu0430u043du0438u00a0 sample. the purpose of u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 - improved accuracy u043au043eu043du0442u0440u043eu043bu00a0 and reducing labour intensity measurements.the device includes a block u043cu0438u043au0440u043eu043fu0435u0440u0435u043cu0435u0449u0435u043du0438u0439 u0438u043du0434u0435u043du0442u043eu0440u0430, including u043fu044cu0435u0437u043eu043au0435u0440u0430u043cu0438u0447u0435u0441u043au0438u0435 nodes with u0448u0442u043eu043au0430u043cu0438, elastic rings with u0442u0435u043du0437u043eu0434u0430u0442 - chicks and electronic chart, the command line parameter is u0430u044eu0449u0443u044e u0442u0435u043du0437u043eu0441u0442u0430u00ab concept, comparator, switch, an analog-to-digital converter, a micro u0437u0432u043c, u0446u0438u0444u0440u043eu0430u043du0430u043bu043eu0433u043eu0432u044bu0439 converter, generator, linear u0438u0437u043cu0435u043du00a0u044eu0449u0435u0433u043eu0441u00a0 nap u0440u00a0u0436u0435u043du0438u00a0 and source of high u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0.improving the accuracy of u0434u043eu0441u0442u0438u0433u0430u0435u0442u0441u00a0 by u043eu0431u0435u0441u043fu0435u0447u0435u043du0438u00a0 evenly u043du0430u0433u0440u0443u0436u0435u043du0438u00a0 and reducing labour intensity through the automation of process measurements. 2 il