首页> 外国专利> method for calibration of a dickenmeßeinrichtung and dickenmeßeinrichtung for thickness measurement and monitoring of layers, tapes, films, or the like

method for calibration of a dickenmeßeinrichtung and dickenmeßeinrichtung for thickness measurement and monitoring of layers, tapes, films, or the like

机译:用来测量厚度,监视层,带,膜等的狄更斯和狄更斯的方法

摘要

A process for calibrating a thickness tester with preferably two travel measuring sensors (2, 3) operating with or without contact is proposed in which thickness testers operating on various measuring principles can be easily calibrated, where the measurement must be performed, by means of a reference object (7).
机译:提出了一种用于校准厚度测试仪的方法,该方法优选具有两个接触或不接触地运行的行程测量传感器(2、3),其中可以容易地校准以各种测量原理运行的厚度测试仪,其中必须借助参考对象(7)。

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