首页> 外国专利> Apparatus and method for measuring repulsive displacement and repulsive force characteristics of a superconductor with respect to a magnet

Apparatus and method for measuring repulsive displacement and repulsive force characteristics of a superconductor with respect to a magnet

机译:用于测量超导体相对于磁体的排斥位移和排斥力特性的装置和方法

摘要

Characteristics of a superconductor such as a repulsive displacement of a superconductor against a magnet or a rotational resistance of the superconductor due to flux-pinning in the superconductor are measured by supporting the superconductor in a non- contact mode; disposing a magnet at a position opposite to the superconductor; and moving the superconductor toward the magnet relatively or increasing the magnetic force of the magnet. The measurement may be carried out while the superconductor is applied with a load or is rotating.
机译:通过以超接触方式支撑超导体来测量超导体的特性,例如超导体相对于磁体的排斥位移或由于超导体中的磁通钉扎而导致的超导体的旋转阻力。在与超导体相对的位置处布置磁体;使超导体相对于磁体移动或增加磁体的磁力。可以在超导体被施加负载或旋转的同时进行测量。

著录项

  • 公开/公告号US5111140A

    专利类型

  • 公开/公告日1992-05-05

    原文格式PDF

  • 申请/专利权人 KOYO SEIKO CO. LTD.;

    申请/专利号US19900489914

  • 发明设计人 RYOICHI TAKAHATA;

    申请日1990-03-07

  • 分类号G01N27/72;G01R33/12;

  • 国家 US

  • 入库时间 2022-08-22 05:22:58

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