首页> 外国专利> METHOD FR MEASURING TOTAL REFLECTION AND OBJECTIVE MIRROR FOR MICROSCOPE FOR MEASURING TOTAL REFLECTION

METHOD FR MEASURING TOTAL REFLECTION AND OBJECTIVE MIRROR FOR MICROSCOPE FOR MEASURING TOTAL REFLECTION

机译:用于测量总反射率的显微镜法和用于测量总反射率的物镜

摘要

PURPOSE:To enable a total reflection to be measured easily using a microscope. CONSTITUTION:Cassegrainian mirrors 12 and 14 and a flat convex lens 32C are provided, a convex surface of the flat convex lens 32C is allowed to oppose a convex mirror 12, its center axis is matched to a center axis C of the Cassegrainian mirrors and the plane center point is matched to a light-focusing position according to a Cassegrainiam mirror 10. While a sample 30 is in contact with a plane of the flat convex lens 32C, a flux of light is allowed to enter a hole 12a, the flux of light is reflected on the convex surface mirror 14 and then the concave surface mirror 12 in this order, the flux of light is focused at the center point of the plane of the flat convex lens 32C, and the flux of light is reflected on the sample 30, the convex surface mirror 12, and the convex surface mirror 14 in this order, thus enabling the flux of light radiated from the hole 12a to be detected.
机译:目的:为了能够使用显微镜轻松地测量全反射。构成:设有卡塞格林镜12和14以及平凸透镜32C,使平凸透镜32C的凸面与凸镜12相对。其中心轴与卡塞格林镜的中心轴C相匹配。根据Cassegrainiam反射镜10,该平面中心点与聚光位置匹配。当样品30与平面凸透镜32C的平面接触时,允许光通量进入孔12a,在凸面镜14上依次反射光,然后在凹面镜12上依次反射,光通量聚焦在平面凸透镜32C的平面的中心点,并且光通量在样品上反射。如图30所示,凸面镜12和凸面镜14以此顺序,从而使得能够检测从孔12a辐射的光通量。

著录项

  • 公开/公告号JPH04348254A

    专利类型

  • 公开/公告日1992-12-03

    原文格式PDF

  • 申请/专利权人 JASCO CORP;

    申请/专利号JP19910186804

  • 发明设计人 KAWASAKI KAZUHIRO;MIYAZAKI SUNAO;

    申请日1991-07-01

  • 分类号G01N21/27;G02B17/00;G02B21/04;

  • 国家 JP

  • 入库时间 2022-08-22 05:15:43

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