首页>
外国专利>
METHOD FR MEASURING TOTAL REFLECTION AND OBJECTIVE MIRROR FOR MICROSCOPE FOR MEASURING TOTAL REFLECTION
METHOD FR MEASURING TOTAL REFLECTION AND OBJECTIVE MIRROR FOR MICROSCOPE FOR MEASURING TOTAL REFLECTION
展开▼
机译:用于测量总反射率的显微镜法和用于测量总反射率的物镜
展开▼
页面导航
摘要
著录项
相似文献
摘要
PURPOSE:To enable a total reflection to be measured easily using a microscope. CONSTITUTION:Cassegrainian mirrors 12 and 14 and a flat convex lens 32C are provided, a convex surface of the flat convex lens 32C is allowed to oppose a convex mirror 12, its center axis is matched to a center axis C of the Cassegrainian mirrors and the plane center point is matched to a light-focusing position according to a Cassegrainiam mirror 10. While a sample 30 is in contact with a plane of the flat convex lens 32C, a flux of light is allowed to enter a hole 12a, the flux of light is reflected on the convex surface mirror 14 and then the concave surface mirror 12 in this order, the flux of light is focused at the center point of the plane of the flat convex lens 32C, and the flux of light is reflected on the sample 30, the convex surface mirror 12, and the convex surface mirror 14 in this order, thus enabling the flux of light radiated from the hole 12a to be detected.
展开▼