首页> 外国专利> MANUFACTURE OF ION-SENSITIVE FIELD EFFECT TRANSISTOR HAVING TA2O5 HYDROGEN ION-SENSITIVE FILM

MANUFACTURE OF ION-SENSITIVE FIELD EFFECT TRANSISTOR HAVING TA2O5 HYDROGEN ION-SENSITIVE FILM

机译:具有TA2O5氢离子敏感膜的离子敏感场效应晶体管的制造

摘要

PURPOSE: To obtain a method by which an ion-sensitive field effect transistor(ISFET) which has high sensitivity, a stable operating characteristic, and a Ta2O5 hydrogen ion-sensitive film and to which a wafer unit process can be adopted and the productivity and stability of an element are largely improved. ;CONSTITUTION: In a method for forming Ta2O5 film, a Ta2O5 film is heat-treated for about one hour at 375-450°C in an oxygen atmosphere after the film is formed on the Si3N4/SiO2 gate insulating film of a pH-ISFET manufactured to a thickness of 400-500Å by the well known method by using an RF reactive sputtering method. The Ta2O5 formed on the other part than the gate area of the pH-ISFET can be removed by using a lift-off method utilizing a positive photosensitive film.;COPYRIGHT: (C)1993,JPO
机译:目的:获得一种灵敏度高,工作特性稳定,Ta 2 O 5 氢离子的离子敏感场效应晶体管(ISFET)的方法感光膜并且可以采用晶片单元处理,并且大大提高了元件的生产率和稳定性。 ;构成:在形成Ta 2 O 5 膜的方法中,Ta 2 O 5 膜是加热的在Si 3 N 4 / SiO 2 制造厚度为400-500 gate的pH-ISFET的栅绝缘膜;通过使用RF反应溅射法的众所周知的方法。 pH-ISFET的栅极区域以外的部分上形成的Ta 2 O 5 可以通过使用正型感光性膜的剥离法除去。版权:(C)1993,日本特许厅

著录项

  • 公开/公告号JPH05107224A

    专利类型

  • 公开/公告日1993-04-27

    原文格式PDF

  • 申请/专利权人 SOHN BYUNG KI;KIN TOCHIN;

    申请/专利号JP19910330489

  • 发明设计人 SOHN BYUNG KI;KWON DAE H;

    申请日1991-12-13

  • 分类号G01N27/414;H01L29/784;

  • 国家 JP

  • 入库时间 2022-08-22 05:15:09

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