首页> 外国专利> NONDESTRUCTIVE THICKNESS MEASURING METHOD AND NONDESTRUCTIVE ABNORMALITY DETECTING METHOD FOR SOLID DIELECTRIC SUBSTANCE

NONDESTRUCTIVE THICKNESS MEASURING METHOD AND NONDESTRUCTIVE ABNORMALITY DETECTING METHOD FOR SOLID DIELECTRIC SUBSTANCE

机译:固体介电物质的非破坏性厚度测量方法和非破坏性异常检测方法

摘要

PURPOSE: To provide the thickness measuring method nondestructively measuring the thickness of a molded portion made of plastic, rubber, or paper of a solid dielectric substance, e.g. an electric wire, a cable connection section (joint section), or an insulator. ;CONSTITUTION: In the nondestructive thickness measuring method of a solid dielectric substance, DC voltage is applied to the solid dielectric substance to be measured by a high-voltage power source 24, dielectric charges are generated on the solid dielectric substance 10, then pulse voltage is applied by a pulse generator 25, and elastic waves are generated in the solid dielectric substance 10. The elastic waves are converted into the electric signal by a piezoelectric element 22 to obtain the signal wave-form, and the thickness of the solid dielectric substance 10 is determined from the signal wave-form.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:提供一种厚度测量方法,该方法可以无损地测量由塑料,橡胶或固体介电质纸制成的模制部分的厚度。电线,电缆连接部分(接头部分)或绝缘子。 ;组成:在固体介电物质的非破坏性厚度测量方法中,将直流电压施加到要通过高压电源24测量的固体介电物质上,在固体介电物质10上产生介电电荷,然后产生脉冲电压通过脉冲发生器25施加电磁波,在固体电介质10中产生弹性波。利用压电元件22将弹性波转换成电信号,从而获得信号波形和固体电介质的厚度。 10由信号波形确定。版权所有:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH05141950A

    专利类型

  • 公开/公告日1993-06-08

    原文格式PDF

  • 申请/专利权人 FUJIKURA LTD;

    申请/专利号JP19910330001

  • 申请日1991-11-19

  • 分类号G01B17/02;G01B7/00;G01B7/06;G01N27/00;

  • 国家 JP

  • 入库时间 2022-08-22 05:13:20

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