首页> 外国专利> NONDESTRUCTIVE HARDNESS EVALUATION METHOD, NONDESTRUCTIVE HARDNESS EVALUATING APPARATUS AND HARDNESS-MEASURING DEVICE USED FOR NONDESTRUCTIVE HARDNESS EVALUATION

NONDESTRUCTIVE HARDNESS EVALUATION METHOD, NONDESTRUCTIVE HARDNESS EVALUATING APPARATUS AND HARDNESS-MEASURING DEVICE USED FOR NONDESTRUCTIVE HARDNESS EVALUATION

机译:用于非破坏性硬度评估的非破坏性硬度评估方法,非破坏性硬度评估装置和硬度测量装置

摘要

PPROBLEM TO BE SOLVED: To provide a method capable of nondestructively evaluating the hardness state of the surface layer of an object, using X-ray diffraction. PSOLUTION: A master component is subjected to X-ray diffraction analysis, and diffraction line widths based on diffracted X-rays are measured, thereby a database which prescribes the relation among the diffraction line widths and the hardness of the surface with respect to a master component is obtained, and a master curve which prescribes the relation between the hardness and the depth of a hardened layer. Next, a mass-produced hardened component which is a test body, is subjected to X-ray diffraction analysis similar to before, and diffraction line widths are acquired; and the hardness and the hardened layer depth of the surface layer of the test substance are estimated, by using the database, the master curve and the diffraction line widths related to the test substance; and then the hardness state of the surface layer of the mass-produced hardened components are evaluated, based on the estimated value. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:

要解决的问题:提供一种能够使用X射线衍射非破坏性地评估物体表面层硬度状态的方法。

解决方案:对主成分进行X射线衍射分析,并测量基于衍射X射线的衍射线宽度,从而建立一个数据库,该数据库规定了衍射线宽度与表面硬度之间的关系获得母材成分的曲线,并规定了硬度和硬化层深度之间关系的母材曲线。接着,与上述同样地,对作为试验体的大量生产的固化成分进行X射线衍射分析,求出衍射线宽度。利用该数据库,估算出该测试物质的表层的硬度和硬化层深度,以及与该测试物质有关的主曲线和衍射线的宽度。然后基于该估计值评估大量生产的硬化部件的表面层的硬度状态。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2007271600A

    专利类型

  • 公开/公告日2007-10-18

    原文格式PDF

  • 申请/专利权人 NATIONAL UNIV CORP SHIZUOKA UNIV;

    申请/专利号JP20060270971

  • 发明设计人 SAKAIDA YOSHIHISA;

    申请日2006-10-02

  • 分类号G01N23/20;

  • 国家 JP

  • 入库时间 2022-08-21 21:16:07

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