PIN SCAN-IN TYPE LSI LOGIC CIRCUIT, PIN SCAN-IN SYSTEM DRIVING CIRCUIT, AND CIRCUIT MOUNTING BOARD TEST METHOD

摘要

A pin scan-in system driving circuit for driving pin scan-in circuits for detecting short-circuits and breakages of the interconnections of a circuit mounting board, the driving circuit having a small number of gates. The pin scan-in system driving circuit is for driving a pin scan-in circuit disposed in an LSI logic circuit, and in the LSI logic circuit there are provided with pin scan-in circuit selection means for selecting a pin scan-in circuit, and selection-state keeping means for keeping the state selected by the pin scan-in circuit selection means.