High resolution observation apparatus with photon scanning tunneling microscope

摘要

A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample (2) and detects detailed distribution of optical constants of the sample (2). Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiated to the sample material coated on the top surface of an optical prism (1). The apparatus includes means (7) for maintaining a predetermined distance between the sample and an optical fiber tip or means (11) for detecting a positioning signal. This positioning signal can be derived from the evanescent wave of one of a plurality of wavelengths of the incident light or signals which correspond to scanning tunnel current (STM), atomic force (AFM), magnetic force, frictional force, ultrasonic wave, heat, ionic conductivity and other physical parameters are used. The apparatus can be utilized as ultra-high density optical read and write memory system. Further, it becomes possible to detect fluorescent condition of the sample (2).