FUNCTION TEST GENERATION METHOD FOR PRINTED CIRCUIT BOARD BASED ON PATTERN MATCHING OF MODEL

摘要

PURPOSE: To promote generation of an in-circuit test by identifying a plurality of devices which can be tested together as a set (cluster) of devices and taking out a test routine from a library. ;CONSTITUTION: A data required for generating test is contained in an electric data base 112, a device model library 108 and a cluster model library. The cluster model library contains a plurality of previously generated generic cluster model. Several different cluster model libraries, each having a different purpose, are constituted. Electrical description of a printed circuit board PCB from the electric data base 112 is analyzed and a plurality of devices which can be tested together as a cluster are identified automatically. Subsequently, a previously defined test routine is taken out automatically from the library for each cluster thus quickening generation of in-circuit test.;COPYRIGHT: (C)1994,JPO