memory with built-in logic lsi and lsi test method.

摘要

This invention relates to a memory incorporating logic LSI and a method for testing the same LSI. Signal path switching circuit portions (50, 51) are disposed in the course of a memory portion (30) and a logic circuit portion (20) so that a test signal input and an output signal can be observed at the input and output terminal portion (40) so as to be able to effect a dynamic function test of the memory portion (30). Further there is disposed a logic circuit testing signal memory circuit portion (80), which switches over the signal path switching circuit portions (50, 51) to the logic circuit portion (20) so as to be able to effect a test of the logic circuit portion (20), independently of the state of the memory portion (30)