首页> 外国专利> Texture and stress analysis and crystal orientation determn. method - involves exposing specimen to x-rays and measuring radiation from specimen with energy resolution detector at various output angles

Texture and stress analysis and crystal orientation determn. method - involves exposing specimen to x-rays and measuring radiation from specimen with energy resolution detector at various output angles

机译:纹理和应力分析以及晶体取向确定。方法-涉及将样品暴露于X射线并使用能量分辨率检测器以各种输出角度测量样品的辐射

摘要

The specimen is exposed to x-radiation and the radiation emanating from the specimen is measured by an energy resolving detector at different output angles, which are varied in steps and at which the detector is arranged wrt. the specimen surface. The specimen is stepwise rotated at various rotation angles about the normal to the surface. The intensity maxima of the electrical output signals are measured. The specimen is exposed to polychromatic primary radiation, and the specimen tilt is 0 deg. for all measurements. ADVANTAGE-Ensures that region of specimen does not change during texture and stress analysis and enables essentially more rapid determination of unknown crystal orientations than conventional techniques.
机译:将样品暴露于X射线,并由能量分辨检测器以不同的输出角度测量从样品发出的辐射,该输出角度是逐步变化的,并且检测器在此位置处布置。标本表面。样品围绕表面的法线以各种旋转角度逐步旋转。测量电输出信号的最大强度。样品暴露于多色主辐射下,且样品倾斜度为0度。用于所有测量。优势-确保样品区域在纹理和应力分析过程中不会发生变化,并且与传统技术相比,能够更快速地确定未知的晶体取向。

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