首页>
外国专利>
Component temp measuring system using microprocessor IC - estimates component temp from temp-dependent electrical parameter of IC device
Component temp measuring system using microprocessor IC - estimates component temp from temp-dependent electrical parameter of IC device
展开▼
机译:使用微处理器IC的组件温度测量系统-根据与IC设备相关的温度电气参数估算组件温度
展开▼
页面导航
摘要
著录项
相似文献
摘要
The temp. measuring system monitors an electrical parameter of one element of the IC (7) which is dependant on the temp. to allow the component temp to be estimated using the known temp difference between the IC element and the component (1). Pref. the measured electrical parameter comprises the current of an element supplied with a temp-stabilised voltage, or the voltage of an element receiving a temp. stabilised current. The measured temp. difference is processed by an A-D converter and microprocessor and input into a memory in the form of characteristic lines and/or correction values. USE/ADVANTAGE - Measuring temp. of coil instruments or LCDs. Requires min. additional complexity.
展开▼