首页> 外国专利> Amorphous semiconductor, amorphous semiconductor device using hydrogen radicals

Amorphous semiconductor, amorphous semiconductor device using hydrogen radicals

机译:非晶半导体,使用氢自由基的非晶半导体器件

摘要

Amorphous semiconductor thin film is exposed to an atmosphere of hydrogen radical during or after the formation of thin film, or is subject to light irradiation having a density of not less than 10 W/cm. sup.2 at a wavelength of 300 to 700 nm during the formation of the thin film. The obtained thin film has improved, i.e. small, photo deterioration. The semiconductor device using the above thin film is preferably applied to solar cells or thin film transistors.
机译:非晶半导体薄膜在形成薄膜的过程中或之后暴露于氢自由基的气氛中,或经受密度不小于10W / cm的光辐照。在薄膜的形成过程中,在波长为300至700nm的Sup.2。所获得的薄膜具有改善的光劣化,即较小的光劣化。使用上述薄膜的半导体器件优选应用于太阳能电池或薄膜晶体管。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号