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CROSS-SECTION OBSERVATION SAMPLE AND OBSERVATION METHOD USING THE SAME

机译:横断面观察样品及使用该样品的观察方法

摘要

PURPOSE: To make appropriate the state of a device cross-section which is to be observed by a transmission electron microscope and obtain such cross-section state easily. ;CONSTITUTION: A first trench 16 which has a width at least the same as the width of a thin plate shape observation cross-sectional part 12 is formed on both sides of the observation cross-sectional part 12 by cutting off a sample 10 between its facing walls so as to leave the thin plate shape observation cross-sectional part 12 and reinforcing leg parts 14. Further, second trenches 18 which are linked with the first trench 16 are formed around the reinforcing leg parts 14. With this constitution, as the influence of a load from the facing walls of the sample 10 is not applied to the observation cross-sectional part 12, the flatness between the reinforcing leg parts 14 can be maintained, so that a resolution at the time of observation with a transmitting medium can be improved.;COPYRIGHT: (C)1995,JPO
机译:目的:使透射电子显微镜观察的器件横截面状态合适,并易于获得这种横截面状态。组成:第一沟槽16的宽度至少与薄板形观察截面部分12的宽度相同,该第一沟槽16通过在其横截面之间切下样品10而形成在观察截面部分12的两侧。而且,在加强脚部14的周围形成有与第一沟槽16连接的第二沟槽18。来自样品10的相对壁的载荷的影响没有施加到观察截面部分12,可以保持加强腿部分14之间的平坦度,从而可以利用透射介质观察时的分辨率。改进。;版权:(C)1995,日本特许厅

著录项

  • 公开/公告号JPH07176581A

    专利类型

  • 公开/公告日1995-07-14

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LTD;TOKYO ELECTRON F II KK;

    申请/专利号JP19930344136

  • 发明设计人 KUMAGAI ICHIRO;

    申请日1993-12-17

  • 分类号H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-22 04:27:56

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