LIGHT EMISSION SCANNING TUNNELING MICROSCOPE AND MICROSCOPIC MEASUREMENT

摘要

PURPOSE: To provide a title invention which has high spatial resolution and high sensitivity and enables an optical evaluation of not only the sample surface but also the quantum structure embedded in a depth of this sample. ;CONSTITUTION: The following are provided: a transparent probe 1 made of a high-transmittance material having a very thin film 3 of simple metal deposited over the surface so as to transmit light and arranged vertically to a sample surface 4a; a bias power source 5 which impresses bias voltage through the transparent probe 1 and the sample 4 via the thin film 3 of simple metal; and a photodetector 8 which is connected to the other end of an optical waveguide 2 to detect light L emitted from the sample 4.;COPYRIGHT: (C)1994,JPO