PRODUCTION OF PATTERN DATA FOR FUNCTION TEST OF LSI

摘要

PURPOSE: To easily produce pattern data for testing, which is optimum for individual testing devices and testing conditions when a function test regarding logic LSIs of the same type is made by using a plurality of testing devices or when a testing condition is changed. ;CONSTITUTION: When pattern data for function testing regarding an LSI is produced, a diagnostic CAD computer 11 produces its raw data on the basis of logic design data on the LSI. A computer 12 for a test system corrects the raw data on the basis of LSI process data and tester-inherent data, and it produce the pattern data. Consequently, even when the tester-inherent data, a testing condition, a production process and the like are changed, it is sufficient to correct only the raw data according to the tester-inherent data and the process data, and it is not required to compute the raw data again by means of the diagnostic CAD computer. As a result, the pattern data for function testing, which is optimum according to the characteristic of a logic LSI, the characteristic of a tester and the like can be created.;COPYRIGHT: (C)1995,JPO