Test pattern creation manner of system LSI, being the manner which creates the test pattern in order to test each function

摘要

PROBLEM TO BE SOLVED: To provide a test pattern creation method, a test pattern creation device, a test method and a test circuit for shortening a test time of a functional circuit block (IP) on a system LSI.;SOLUTION: This test pattern creation method creates a test pattern for testing each function of a plurality of functional circuit blocks integrated on the system LSI. The method is characterized by shortening the total test time by using a parallel access technique, a serial access technique, and additionally a parallel/serial mixed access technique, if necessary, combinationally to each IP, and by reducing an unused region of an LSI pin. This test method created in this way is also provided.;COPYRIGHT: (C)2003,JPO