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PRODUCTION OF LOW-RESISTANCE ZNSE SINGLE CRYSTAL SUBSTRATE

机译:低电阻ZNSE单晶衬底的生产

摘要

PURPOSE: To obtain a low-resistance ZnSe single crystal by dipping a ZnSe single crystal grown by solid-phase growth in a mixture of molten Zn and molten In, Ga or Al. ;CONSTITUTION: A ZnSe single crystal 3 grown by solid-phase growth is degreased, cleaned, then etched at 110-115°C for 15min with aq. NaOH, washed with water and dried. The treated ZnSe single crystal 3 is put in a quartz ampule 1 along with a molten mixture 2 of Zn and In where In/Zn=4-50mol% (or Ga and Al) and sealed at about 10-6Torr. A quartz presser rod 4 is put in to prevent the floating of the ZnSe single crystal 3. The entire ampule 1 is dipped in the molten mixture 2 at 800-1000°C for several to several hundred hours, and then the ZnSe single crystal 3 is separated. The resistivity of the ZnSe single crystal is lowered to ≤10Ωcm from ≥106Ωcm before dipping.;COPYRIGHT: (C)1995,JPO
机译:目的:通过将通过固相生长而生长的ZnSe单晶浸入熔融的Zn和熔融的In,Ga或Al的混合物中,以获得低电阻的ZnSe单晶。组成:将固相生长的ZnSe单晶3进行脱脂,清洗,然后在110-115°C的温度下蚀刻15分钟。 NaOH,用水洗涤并干燥。将处理后的ZnSe单晶3与Zn和In的熔融混合物2(其中In / Zn = 4-50mol%(或Ga和Al))一起放入石英安瓿1中,并密封在约10 -6 Torr。放入石英压棒4以防止ZnSe单晶3漂浮。将整个安瓿1在800-1000℃下浸入熔融混合物2中数小时至数百小时,然后将ZnSe单晶3浸入。分开了。浸渍前,ZnSe单晶的电阻率从≥10 6 Ωcm降低到≤10Ωcm。版权所有:(C)1995,日本特许厅

著录项

  • 公开/公告号JPH07118098A

    专利类型

  • 公开/公告日1995-05-09

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC IND LTD;

    申请/专利号JP19930287526

  • 发明设计人 KURISU KENICHI;

    申请日1993-10-21

  • 分类号C30B29/48;C30B33/10;H01L33/00;

  • 国家 JP

  • 入库时间 2022-08-22 04:21:38

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