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Systems for calibration of optical instrument on satellite with reference light source

机译:具有参考光源的卫星光学仪器校准系统

摘要

A calibration system for periodically calibrating an optical instrument on board a satellite with reference light. In the disclosed system, a calibration unit has two photodetectors one of which is positioned near the light source which radiates reference light and the other near the aperture from which the reference light emerges toward optics of the instrument. Therefore, it is possible to discriminate between contamination or degradation of the optical instrument and contamination of the calibration unit. Two identical and independent calibration units are employed to provide redundancy and enhance the accuracy of calibration.
机译:一种校准系统,用于用参考光定期校准卫星上的光学仪器。在所公开的系统中,校准单元具有两个光电检测器,其中之一位于辐射参考光的光源附近,另一个位于参考光从其射向仪器的光学器件的孔附近。因此,可以在光学仪器的污染或退化与校准单元的污染之间进行区分。使用两个相同且独立的校准单元来提供冗余并提高校准的准确性。

著录项

  • 公开/公告号EP0533490B1

    专利类型

  • 公开/公告日1995-05-17

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号EP19920308526

  • 发明设计人 SHIMIZU YUKIHARUC/O NEC CORPORATION;

    申请日1992-09-18

  • 分类号G01M11/00;G01J1/08;

  • 国家 EP

  • 入库时间 2022-08-22 04:13:34

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