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Electrical junction device with lightly doped buffer region to precisely locate a p-n junction

机译:具有轻掺杂缓冲区的电结器件,可精确定位p-n结

摘要

An electrical junction is precisely located between a highly p doped semiconductor material and a more lightly n doped semiconductor material by providing a lightly p doped buffer region between the two materials, with a doping level on the order of the n doped material's. The buffer region is made wide enough to establish an electrical junction at approximately its interface with the n doped material, despite a diffusion of dopant from the p doped material. When applied to a heterojunction bipolar transistor (HBT), the transistor's base serves as the heavily p doped material and its emitter as the more lightly n doped material. The buffer region is preferably employed in conjunction with a graded superlattice, located between the buffer and emitter, which inhibits dopant diffusion from the base into the emitter. A p-n junction is formed within the superlattice, which functions on one side as an electrical extension of the emitter and on the other side as an electrical extension of the buffer, and establishes the electrical junction at the p-n junction location. The precise positioning of the electrical junction results in a known and repeatable emitter-base turn- on voltage.
机译:通过在两种材料之间提供轻度p掺杂的缓冲区域,其掺杂水平约为n掺杂材​​料的数量,在高p掺杂的半导体材料和轻度n掺杂的半导体材料之间精确地定位电结。尽管掺杂剂从p掺杂材料中扩散出来,但使缓冲区域足够宽以在其与n掺杂材料的大致界面处建立电结。当应用于异质结双极晶体管(HBT)时,该晶体管的基极用作重度p掺杂的材料,其发射极用作轻度n掺杂的材料。缓冲区优选与位于缓冲区和发射极之间的渐变超晶格结合使用,该超晶格抑制掺杂剂从基极扩散到发射极中。在超晶格内形成p-n结,其一侧用作发射极的电扩展,另一侧用作缓冲区的电扩展,并在p-n结位置建立电结。电结的精确定位会产生已知且可重复的发射极-基极导通电压。

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