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Process for depositing oxide film on metallic substrate by heat plasma flash evaporation method

机译:热等离子体闪蒸法在金属基底上沉积氧化膜的方法

摘要

The generation of a reaction product is suppressed between a metallic substrate and plasma in depositing a ceramic intermediate layer on the metallic substrate in a process for depositing an oxide film on the metallic substrate by thermal plasma flash evaporation method. Thus, there is no reaction phase in the ceramic intermediate layer and the metallic substrate, and an intermediated buffer layer of only oxide ceramic is deposited on a flat surface of the metallic substrate. The intermediate ceramic layer is deposited in inert atmosphere of a low oxygen concentration at a temperature of less than 600° C. for the metallic substrate. Then, a superconducting thin film is deposited on the ceramic intermediate layer.
机译:在通过热等离子体快速蒸发法在金属基板上沉积氧化物膜的过程中,在金属基板上沉积陶瓷中间层时,抑制了金属基板与等离子体之间反应产物的产生。因此,在陶瓷中间层和金属基板中没有反应相,并且仅氧化物陶瓷的中间缓冲层沉积在金属基板的平坦表面上。对于金属基材,在小于600℃的温度下在低氧浓度的惰性气氛中沉积中间陶瓷层。然后,将超导薄膜沉积在陶瓷中间层上。

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