首页> 外国专利> REACTIVE SPUTTERING DEVICE AND REACTIVE SPUTTERING METHOD AS WELL AS REACTIVE VAPOR DEPOSITION DEVICE AND REACTIVE VAPOR DEPOSITION METHOD

REACTIVE SPUTTERING DEVICE AND REACTIVE SPUTTERING METHOD AS WELL AS REACTIVE VAPOR DEPOSITION DEVICE AND REACTIVE VAPOR DEPOSITION METHOD

机译:活性溅射装置和活性溅射方法以及活性蒸气沉积装置和活性蒸气沉积方法

摘要

PURPOSE: To decrease the fluctuations in the compsn. in the thickness direction of films in the case where the films are simultaneously formed on the surfaces of many substrates or the films are formed on a large-area substrate in a reactive sputtering method and reactive vapor deposition method. ;CONSTITUTION: A device which executes sputtering while rotating a substrate holder 53 holding the plural substrates 1, or a device which executes sputtering while moving the large-area substrate in parallel right above a target or a device for executing vapor deposition while moving the large-area substrate in parallel right above a vapor deposition source is provided with a mask means 63 covering the surface of the substrate and is provided with an aperture near a position facing the target 51 of the mask means or the vapor deposition source. The deposition of the active species of reactive gases is suppressed on the surface of the substrate 1 covered with the mask means 63 and the sputtered films or vapor deposited films are formed on the surface of the substrate 1 near the aperture of the mask means 63 when the active species depositable as solids on the substrate are used as the reactive gases.;COPYRIGHT: (C)1996,JPO
机译:目的:减少组件的波动。在通过反应溅射法和反应气相沉积法同时在许多基板的表面上形成膜或在大面积基板上形成膜的情况下,在膜的厚度方向上沿膜的厚度方向。 ;构成:一边旋转一边保持多个基板1的基板支架53一边进行溅射​​的装置,或使大面积基板在目标上方平行地移动的同时进行溅射的装置,或一边使大型基板移动一边进行蒸镀的装置。在气相沉积源正上方平行的区域基板上,设有覆盖基板表面的掩模装置63,并且在与该掩模装置或气相沉积源的靶51相对的位置附近具有开口。当基板1的被掩模装置63覆盖的表面上时,抑制了反应性气体的活性物质的沉积,并且当基板1的表面上在掩模装置63的孔附近时形成了溅射膜或气相沉积膜。以固体形式沉积在基质上的活性物质作为反应气体。版权所有:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH08269710A

    专利类型

  • 公开/公告日1996-10-15

    原文格式PDF

  • 申请/专利权人 TDK CORP;

    申请/专利号JP19950099952

  • 发明设计人 USUDA MASATO;HAGIWARA ATSUSHI;

    申请日1995-03-31

  • 分类号C23C14/34;C23C14/04;C23C14/50;

  • 国家 JP

  • 入库时间 2022-08-22 04:03:47

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