MAXIMUM DRIVING LOAD CHECKING DEVICE, MAXIMUM DRIVING LOAD CHECKING METHOD, DESIGN METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND SEMICONDUCTOR INTEGRATED

摘要

PURPOSE: To consider the influence of resistance components in addition to capacitance components and to check the maximum driving load of a macrocell by comparing and checking RC time constants for every FO destination of the macrocells inside an RC report and the maximum RC time constant of the macrocells. ;CONSTITUTION: This maximum driving load checking device is composed of a CPU 20, a memory 21, a display device 22 and an input device 23 and the processing of checking the maximum driving load is mostly performed inside the CPU 20. The RC time constants for every FO destination of the respective macrocells are calculated by using an Elmore model after extracting wiring capacitance and wiring resistance, etc., from layout information and the calculated RC time constants, synthesized capacitance and synthesized resistance, etc., are held inside the memory 21. Then, the drivable maximum capacitance value and maximum resistance value of the respective macrocells are extracted by circuit simulation and thus, the maximum RC time constant is obtained beforehand and the maximum RC time constant and the RC time constant inside the RC report are compared and checked.;COPYRIGHT: (C)1996,JPO