首页> 外国专利> ION-IMPLANTATION APPARATUS AND ION BEAM NEUTRALIZING APPARATUS TO BE EMPLOYED THEREFOR AND METHOD FOR INTRODUCING NEGATIVE CHARGE ELECTRON INTO POSITIVE CHARGE ION BEAM

ION-IMPLANTATION APPARATUS AND ION BEAM NEUTRALIZING APPARATUS TO BE EMPLOYED THEREFOR AND METHOD FOR INTRODUCING NEGATIVE CHARGE ELECTRON INTO POSITIVE CHARGE ION BEAM

机译:所采用的离子注入装置和离子束中和装置以及将负电荷电子引入正电荷离子束的方法和方法

摘要

PROBLEM TO BE SOLVED: To provide a beam-neutralizing apparatus which neutralizes ion beam and prevents a wafer from being charged, and to provide an ion-implantation apparatus. ;SOLUTION: An ion-beam neutralizing apparatus 150 comprises electron- emitting filaments 210a-210f and an electron deflector 226 which induces electrodes from an electron source into an ion beam 20. Electric potential bias suitable for accelerating electrons in the direction of parting generated electrons from the filaments 210a-210f is applied to an acceleration grid 220 from an electric power source. Electrons pass an electric field which is restricted by a second grid 224. The electrons pass the second grid and are deflected by an electric field between the second grid 224 and a parabolic metal deflector 226. Consequently, the ion beam is neutralized before the ion beam comes into collision with a wafer.;COPYRIGHT: (C)1996,JPO
机译:解决的问题:提供一种中和离子束并防止晶片带电的束中和装置,并提供一种离子注入装置。 ;解决方案:离子束中和装置150包括电子发射灯丝210a-210f和电子偏转器226,该电子偏转器226将电极从电子源感应到离子束20中。电势偏置适合于沿分离电子的方向加速电子。细丝210a-210f中的线束从电源被施加到加速栅格220。电子通过由第二栅极224限制的电场。电子通过第二栅极,并被第二栅极224和抛物线形金属偏转器226之间的电场偏转。因此,离子束在离子束之前被中和。与晶片碰撞。版权所有:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH0855600A

    专利类型

  • 公开/公告日1996-02-27

    原文格式PDF

  • 申请/专利权人 EATON CORP;

    申请/专利号JP19950189882

  • 发明设计人 BENVENISTE VICTOR M;

    申请日1995-07-03

  • 分类号H01J37/317;C23C14/48;H01L21/265;

  • 国家 JP

  • 入库时间 2022-08-22 03:56:23

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