首页> 外国专利> Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons

Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons

机译:双反射阴极发光检测器,对反向散射电子具有极高的分辨力

摘要

A parabolic reflector and an inclined planar light reflector in a cathodoluminescence detector are integrated with a set of photo- sensitive solid-state detector cells mounted in quadrature on a supporting plate, and supported by an electron microscope vacuum chamber specimen stage adaptor unit. Designed for CL emission operation in an electron microscope, the parabolic light reflector, the inclined planar light reflector and the photo-sensitive, solid-state detector cells are optically aligned and mechanically combined through the supporting plate of the detector cells. A readily exchangeable unit is thus obtained. The unit is further supported by the specimen stage adaptor unit so as to obtain a mechanical unit which can easily be mounted in and removed from any standard electron microscope vacuum chamber stage as a single integrated unit.
机译:阴极荧光检测器中的抛物面反射器和倾斜的平面光反射器与一组正交安装在支撑板上的光敏固态检测器单元集成在一起,并由电子显微镜真空室样品台适配器单元支撑。为在电子显微镜中进行CL发射操作而设计,抛物线形光反射器,倾斜的平面光反射器和光敏的固态检测器单元通过检测器单元的支撑板进行光学对准并机械组合。由此获得易于更换的单元。该单元进一步由样品台适配器单元支撑,以便获得一个机械单元,该机械单元可以作为单个集成单元轻松地安装到任何标准电子显微镜真空室平台中或从其中移除。

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