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Apparatus and methods employing harmonic analysis for measuring the difference in phase between two coherent beams

机译:使用谐波分析测量两个相干光束之间的相位差的设备和方法

摘要

An improved interferometric measuring system that includes a system for measuring a phase difference between two coherent beams oscillating at substantially the same frequency, and including a phase modulator disposed into optical communication with one of the coherent beams and being adapted to generate a phase modulated beam signal. A beam combiner combines the phase modulated beam signal with the second one of the coherent beams to generate a combined beam signal. A detector element measures the intensity of the combined beam signal and a date processor analyzes the intensity to determine from the harmonic components of the combined beam signal the phase difference between the two coherent beams.
机译:一种改进的干涉测量系统,包括用于测量以基本上相同的频率振荡的两个相干光束之间的相位差的系统,并且包括布置成与所述相干光束之一进行光通信并且适于产生相位调制光束信号的相位调制器。 。光束组合器将相位调制光束信号与相干光束中的第二个相组合以产生组合光束信号。检测器元件测量组合光束信号的强度,并且日期处理器分析该强度,以从组合光束信号的谐波分量确定两个相干光束之间的相位差。

著录项

  • 公开/公告号US5543914A

    专利类型

  • 公开/公告日1996-08-06

    原文格式PDF

  • 申请/专利权人 SPARTA INC.;

    申请/专利号US19950372226

  • 发明设计人 PHILIP D. HENSHAW;STEVEN A. LIS;

    申请日1995-01-13

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-22 03:38:10

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