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Semiconductor memory device with error self-correction system starting parity bit generation/error correction sequences only when increase of error rate is forecasted
Semiconductor memory device with error self-correction system starting parity bit generation/error correction sequences only when increase of error rate is forecasted
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机译:具有错误自校正系统的半导体存储器件仅在预测错误率增加时才启动奇偶校验位生成/错误校正序列
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摘要
A semiconductor memory device has a built-in error correction system for correcting undesirably inverted data bits, and the built-in error correction system starts a parity bit generating sequence and an error correcting sequence only when increase of error rate is forecasted, thereby increasing the access speed without sacrifice of the reliability.
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