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Timing model and characterization system for logic simulation of integrated circuits which takes into account process, temperature and power supply variations

机译:用于集成电路逻辑仿真的时序模型和特征分析系统,该仿真模型考虑了过程,温度和电源变化

摘要

A method determines approximate propagation delay through logic devices within a library. Each logic cell within the library is characterized at baseline conditions to obtain parameters for each logic cell which define propagation delay through each logic cell at the baseline conditions. A subset of the logic cells are characterized at conditions varying from the baseline conditions to obtain scaling parameters. The scaling parameters modify values of the parameters for all logic cells within the library in order to approximate changes in propagation delay through each logic cell resulting from changes in the baseline conditions. In the preferred embodiment, the conditions varying from the baseline conditions includes a change in at least one of operating temperature, power supply voltage and process conditions.
机译:一种方法确定通过库内逻辑设备的近似传播延迟。库中的每个逻辑单元在基线条件下进行表征,以获得每个逻辑单元的参数,这些参数定义了在基线条件下通过每个逻辑单元的传播延迟。在不同于基线条件的条件下表征逻辑单元的子集以获得缩放参数。缩放参数会修改库中所有逻辑单元的参数值,以近似估计由于基准条件的变化而导致的每个逻辑单元的传播延迟变化​​。在优选实施例中,不同于基线条件的条件包括工作温度,电源电压和工艺条件中至少之一的变化。

著录项

  • 公开/公告号US5559715A

    专利类型

  • 公开/公告日1996-09-24

    原文格式PDF

  • 申请/专利权人 VLSI TECHNOLOGY INC.;

    申请/专利号US19940219585

  • 发明设计人 MICHAEL N. MISHELOFF;

    申请日1994-03-28

  • 分类号G06F17/10;

  • 国家 US

  • 入库时间 2022-08-22 03:37:51

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