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MICROTIP FOR DETECTION OF TUNNEL CURRENT AND ITS MANUFACTURE, AND PROBE FOR DETECTION OF TUNNEL CURRENT OR MICROFORCE AND ITS MANUFACTURE
MICROTIP FOR DETECTION OF TUNNEL CURRENT AND ITS MANUFACTURE, AND PROBE FOR DETECTION OF TUNNEL CURRENT OR MICROFORCE AND ITS MANUFACTURE
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机译:用于检测隧道电流及其制造的微晶,以及用于检测隧道电流或微力及其制造的探针
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摘要
PROBLEM TO BE SOLVED: To obtain a uniform shape of good reproducibility and form a sharp front end by supporting a front end part of a microtip formed of a metallic material by a plurality of leg parts joining a bonding layer. ;SOLUTION: A recessed part is formed at a surface of a first silicon substrate 1. A microtip 5 of a highly conductive metallic material is formed on a release layer formed of an oxide on the substrate 1 including the recessed part. A bonding layer 7 is formed on an elastic body such as a cantilever or the like on a second substrate. The microtip 5 on the substrate 1 is registered with the bonding layer 7 on the second substrate, and faced into touch with each other. Further, a load is impressed, thereby to join the microtip 5 with the bonding layer 7. A tunnel current wiring 10 is connected to the bonding layer 7.;COPYRIGHT: (C)1997,JPO
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