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MANUFACTURE OF SILICON NITRIDE MEMBRANE AND MEMBER OF SILICON NITRIDE MEMBRANE

机译:氮化硅膜的制造和氮化硅膜的成员

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing a silicon nitride membrane having improved X-ray irradiation immunity and a method of manufacturing a silicon nitride membrane member provided with a silicon nitride membrane having improved X-ray irradiation immunity. ;SOLUTION: In this method, manufacture of a silicon nitride membrane 32 in a member provided with a membrane (self-sustaining thin film) 32 consisting of silicon nitride and a supporting frame 21' of the membrane 32 having an opening part W is performed. In this case, the membrane 32 is to be formed by a reduced pressure (CVD method using SiH2Cl2 and NH3 as a reaction gas in a film-forming condition with a temperature inside a reaction furnace of 900°C or almost 900°C besides SiH2Cl2/NH3 (gas flow ratio) of not exceeding 1 or almost 0.3 to 1.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:提供一种具有改善的X射线辐射抵抗力的氮化硅膜的制造方法以及一种制造具有具有改善的X射线辐射抵抗力的氮化硅膜的氮化硅膜构件的方法。 ;解决方案:在该方法中,在具有由氮化硅构成的膜(自持薄膜)32和具有开口部W的膜32的支撑框架21'的部件中制造氮化硅膜32。 。在这种情况下,将通过减压(使用SiH 2 Cl 2 和NH 3 作为反应的CVD方法来形成膜32。除了SiH 2 Cl 2 / NH 3 以外,在成膜条件下,气体在反应炉内的温度为900°C或接近900°C Sub>(气体流量比)不超过1或几乎不超过0.3:1;版权所有:(C)1997,JPO

著录项

  • 公开/公告号JPH09223658A

    专利类型

  • 公开/公告日1997-08-26

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP19960029543

  • 申请日1996-02-16

  • 分类号H01L21/027;G03F1/16;H01L21/318;

  • 国家 JP

  • 入库时间 2022-08-22 03:35:55

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