首页> 外国专利> METHOD FOR CONTROLLING PRIMARY RECRYSTALLIZED GRAIN SIZE OF GRAIN ORIENTED SILICON STEEL SHEET

METHOD FOR CONTROLLING PRIMARY RECRYSTALLIZED GRAIN SIZE OF GRAIN ORIENTED SILICON STEEL SHEET

机译:取向硅钢片的主再结晶晶粒尺寸的控制方法

摘要

PROBLEM TO BE SOLVED: To stably prevent the occurrence of inferior secondary recrystallization causing deterioration in the electromagnetic properties of a product by regulating the desired grain size of primary recrystallized grain size control to the optimum grain size determined according to the fluctuation of Al content, at the time of producing a grain oriented silicon steel sheet by using a silicon steel slab of specific composition. ;SOLUTION: The grain oriented silicon steel sheet is produced by using, as a stock, a slab of a silicon steel containing, by weight, 1.5-4.5% Si, 0.005-0.06% Al, and 0.001-0.015% N. In this manufacturing process, at the time of controlling primary recrystallized grain size, the desired grain size of primary recrystallized grain size control is regulated to the optimum grain size determined according to the fluctuation of Al content. For example, the optimum grain size (d) is determined by the relation in equation 1/d=a[log(%Al)]+b in which Al content is represented by (%Al), where (a) and (b) are contants, respectively.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:为了稳定地防止次次再结晶的发生,从而通过将一次再结晶粒度控制的所需粒度调节到根据Al含量的波动确定的最佳粒度,来稳定地降低产品的电磁性能,二次再结晶不会导致产品电磁性能的下降。使用特定组成的硅钢坯生产晶粒取向硅钢片的时间。 ;解决方案:晶粒取向硅钢片是通过使用以重量计含有1.5-4.5%Si,0.005-0.06%Al和0.001-0.015%N的硅钢坯作为原料生产的。在制造过程中,在控制一次再结晶晶粒尺寸时,将一次再结晶晶粒尺寸控制的所需晶粒尺寸调节至根据Al含量的波动确定的最佳晶粒尺寸。例如,最佳晶粒尺寸(d)由等式1 / d = a [log(%Al)] + b中的关系确定,其中Al含量由(%Al)表示,其中(a)和(b )分别是竞争者。;版权:(C)1997,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号