首页> 外国专利> INSTRUMENT FOR MEASURING TAN DELTA WITHOUT ANY INFLUENCE OF OUTSIDE INDUCED VOLTAGE

INSTRUMENT FOR MEASURING TAN DELTA WITHOUT ANY INFLUENCE OF OUTSIDE INDUCED VOLTAGE

机译:在不影响外部感应电压的情况下测量tanδ的仪器

摘要

PROBLEM TO BE SOLVED: To provide an instrument for measuring tanδ wherein tanδ of various electric devices connected to a single phase cable or a three-phase cable can be accurately measured in a hot line state or a non hot line state. ;SOLUTION: Accurate tanδ is found without any influence of an alternating component as a voltage signal ei proportional to leakage current I of an electric device to be measured H, direct current component output ED having multiplied a signal ev proportional to applied voltage of the device H and other direct current component output EDT obtained to multiply a signal eVT in which the signals ei and ev are 90-degree phase-shifted are made an input signal of a division circuit 14.;COPYRIGHT: (C)1997,JPO
机译:解决的问题:提供一种用于测量tanδ的仪器,其中可以在热线状态或非热线状态下准确地测量连接至单相电缆或三相电缆的各种电气设备的tanδ。 ;解决方案:找到准确的tanδ,而不受交流分量的影响,因为电压信号e i 与要测量的电气设备的泄漏电流I成正比H,直流分量输出ED乘以一个信号e v 与设备H的施加电压和其他直流分量输出EDT成正比,以乘以信号eVT,其中信号e i 和e v < / Sub>相移90度作为分频电路14的输入信号。版权所有:(C)1997,JPO

著录项

  • 公开/公告号JPH0980097A

    专利类型

  • 公开/公告日1997-03-28

    原文格式PDF

  • 申请/专利权人 SOKEN DENKI KK;

    申请/专利号JP19950260731

  • 发明设计人 SUGINO YOSHIO;

    申请日1995-09-13

  • 分类号G01R27/26;G01R27/18;

  • 国家 JP

  • 入库时间 2022-08-22 03:35:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号