首页> 外国专利> METHOD FOR DISCRIMINATING BETWEEN UNTESTABLE FAILURE AND REDUNDANT FAILURE IN SEQUENTIAL LOGIC CIRCUIT

METHOD FOR DISCRIMINATING BETWEEN UNTESTABLE FAILURE AND REDUNDANT FAILURE IN SEQUENTIAL LOGIC CIRCUIT

机译:顺序逻辑电路中不稳定故障和冗余故障之间的判别方法

摘要

PROBLEM TO BE SOLVED: To discriminate between redundant failure and untestable failure by selecting one lead in a sequential circuit and performing analysis while assuming that the sequential circuit can not take first or second value during a given frame of starting time. ;SOLUTION: When a fabricated circuit 12 is tested, an input stimulus is generated from a test generator 11 and applied to the primary input 14 of the circuit 12 and then an output response is measured on the primary output 15. A comparator circuit 16 compares the output response with an expected output response and identifies the failure in the circuit. The test process is normally carried out under control of a computer in an automatic test equipment(ATE). Each circuit to be tested is normally plugged in the ATE system through a standardized interface.;COPYRIGHT: (C)1996,JPO
机译:要解决的问题:通过在时序电路中选择一根引线并进行分析,同时假设时序电路在给定的启动时间内不能取第一值或第二值,来区分冗余故障和不可测试的故障。 ;解决方案:测试装配好的电路12时,会从测试生成器11产生输入激励,并将其施加到电路12的主输入14上,然后在主输出15上测量输出响应。比较器电路16比较具有预期输出响应的输出响应,并识别电路中的故障。测试过程通常在自动测试设备(ATE)中的计算机控制下进行。通常,每个要测试的电路都通过标准化接口插入ATE系统。版权所有:(C)1996,JPO

著录项

  • 公开/公告号JPH08304517A

    专利类型

  • 公开/公告日1996-11-22

    原文格式PDF

  • 申请/专利权人 AT & T CORP;

    申请/专利号JP19950338407

  • 申请日1995-12-26

  • 分类号G01R31/317;G06F11/22;G11C29/00;

  • 国家 JP

  • 入库时间 2022-08-22 03:34:31

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