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Developer null for positive die huotorejisuto of semiconductor production

机译:半导体生产的正片huotorejisuto的开发人员为空

摘要

PURPOSE:To obtain the developing soln. which forms resist patterns having a high residual film rate without having surface layer peeling and film residues by adding a specific alkali soluble resin and org. reducing compd. to the developing soln. for the positive type photoresist essentially consisting of a basic compd. CONSTITUTION:One kind of the alkaline soluble resin selected from a novolak resin, acetone-pyrogallol resin, polyhydroxy styrene and the deriv. thereof and the org. reducing compd., such as hydrazine, hydrazide, carbazete, semicarbazide, guanidine, hydroxamic acid, hydroxyurea or glucose, are added at prescribed ratios to the developing soln. for the positive type photoresist consisting of the basic compd. which consists of one of tetramethyl ammonium hydroxide and trimethyl (2-hydroxyethyl)ammonium hydroxide as its essential components. The excellent positive type photoresist patterns are formed if the developing soln. constituted in such a manner is used.
机译:目的:获得显影液。通过加入特定的碱溶性树脂和有机溶剂,形成具有高残留膜速率的抗蚀剂图案,而没有表面层剥离和膜残留物。减少补偿到发展中的国家。用于正型光致抗蚀剂,基本上由基本成分组成。组成:一种碱溶性树脂,选自线型酚醛清漆树脂,丙酮-邻苯三酚树脂,多羟基苯乙烯及其衍生物。它和组织。将还原性化合物如肼,酰肼,氨基甲酸酯,氨基脲,胍,异羟肟酸,羟基脲或葡萄糖以规定的比例加入到显影液中。用于正型光刻胶的基本组成。它由氢氧化四甲基铵和氢氧化三甲基(2-羟乙基)铵中的一种组成。如果显影,则形成优异的正型光致抗蚀剂图案。使用以这种方式构成的结构。

著录项

  • 公开/公告号JP2589823B2

    专利类型

  • 公开/公告日1997-03-12

    原文格式PDF

  • 申请/专利权人 FUJI PHOTO FILM CO LTD;

    申请/专利号JP19890224929

  • 发明设计人 KAWABE YASUMASA;AKYAMA KEIJI;

    申请日1989-08-31

  • 分类号G03F7/32;

  • 国家 JP

  • 入库时间 2022-08-22 03:30:15

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